A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Intel Corp. said Wednesday that it has redesigned the electronic switches on its chips so that computers can keep getting cheaper and more powerful. The switches, known as transistors, have typically ...

(Nanowerk News) A hacker can reproduce a circuit on a chip by discovering what key transistors are doing in a circuit - but not if the transistor "type" is undetectable. Purdue University engineers ...